Desktop Conveyor
Self-made miniaturized design, mainly integrated into industrial microscopes and AOI systems, and other applications that need to be transported from wafer cassettes, 4/8 inch and 6/8 inch are optional; Pre-Aligner is included/OCR is optional.
keywords: 3D inspection, IC warpage
Category：
Semiconductor EFEM system
Tel：
Details
The main function:
wafer transfer
edge alignment
Juguan personnel inspection: 360-degree rotation
Crystal back inspection: reversible
Features:
Applied to the third generation semiconductor materials
Overcome the edge-finding alignment of transparent and translucent materials
Capable of transporting thinned wafers (>80um)
Application method:
Can be used with various equipment for transmission such as
Desktop microscopes (Leica, Nikon, etc..)
3D measurement equipment
Film Thickness Measuring Instrument
Wafer AOI equipment
4PP probe measuring equipment
Laser marking equipment
The main function:
- wafer transfer
- edge alignment
- Juguan personnel inspection: 360-degree rotation
- Crystal back inspection: reversible
Features:
- Applied to the third generation semiconductor materials
- Overcome the edge-finding alignment of transparent and translucent materials
- Capable of transporting thinned wafers (>80um)
Application method:
Can be used with various equipment for transmission such as
- Desktop microscopes (Leica, Nikon, etc..)
- 3D measurement equipment
- Film Thickness Measuring Instrument
- Wafer AOI equipment
- 4PP probe measuring equipment
- Laser marking equipment
Keywords：
Prev
With Film/Frame Wafer inspection system
Contact：17715518125
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E-mail：Sales@hb-gmose.com
Fax：0512-65308125 -
Address: Room 303, Building 1, No. 3 Xialita Road, Mudu Town, Wuzhong District, Suzhou
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