The composite optical measurement system integrates laser and IR systems for measurement. What functions are included?
Release time:
2022-12-09 08:46
Integrate laser and IR system for measurement of compound optical measurement system, including the following functions:
1. Wafer cutting line IR detection
2. Penetrating multilayer film thickness measurement
3. Wafer thickness, TTV, WARP
Contact：17715518125
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E-mail：Sales@hb-gmose.com
Fax：0512-65308125 -
Address: Room 303, Building 1, No. 3 Xialita Road, Mudu Town, Wuzhong District, Suzhou
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