PRODUCTS CENTER
North Korea Wafer Defect Inspection Machine
It is specially designed for the detection of nano-scale defects, and can detect the particle size of 0.1um. It also includes an image re-inspection system; EFEM OCR/Pre-Aligner is optional.
Category:
Product Description
Contact：17715518125
-
E-mail：Sales@hb-gmose.com
Fax：0512-65308125 -
Address: Room 303, Building 1, No. 3 Xialita Road, Mudu Town, Wuzhong District, Suzhou
Scan to follow us
Copyright ©2022 Jiangsu Hanbo Intelligent Equipment Manufacturing Co., Ltd.