PRODUCTS CENTER
Microscopic defect detection for Wafer, can be used with different feeding systems, can be used with 20X lens to detect 1um defects; optional EFEM, OCR/Pre-Aligner; Wafer semi-finished/finished OQC; SiC / GaN / GaAs / Si / sapphire; Compatible with VCSEL / MEMs / Mini LED / Micro LED; Microscopic objective lens (Nikon 5X~50X) is also available.
Self-made miniaturized design, mainly integrated into industrial microscopes and AOI systems, and other applications that need to be transported from wafer cassettes, 4/8 inch and 6/8 inch are optional; Pre-Aligner is included/OCR is optional.
Manipulators are used to operate wafers, and various standard wafer cassettes and sizes (6/8 inches and 8/12 inches) can be selected; OCR/Pre-Aligner is optional.